Tuesday, May 5, 2020

TCS launches AI-powered solution to detect wafer anomaly in semiconductor manufacturing

The solution harnesses the company's contextual knowledge of the semiconductor industry and the power of deep learning tech, to help chip makers digitally re-imagine their product quality assurance process. Sophisticated quality inspection of wafers during the semiconductor manufacturing process is essential to detect and classify defects early and accurately, TCS said.

from Gadgets Now https://ift.tt/2zaL65k

No comments:

Post a Comment

iPhone SE (2022) Inventory Running Low as iPhone SE 4 Launch Nears: Mark Gurman

Apple is believed to unveil the fourth-generation iPhone SE by April. This timeline follows the company's established trend, with previo...